POFINT is a MS-DOS based program developed in Turbo-Pascal. It provides simple tools for pole figure interpretation and corrections, file transformations for many experimental purposes, and without having necessity to work with large exploitation systems:
0 - Direct normalisation of pole figures
1 - Poles uncertainties after corrections
2 - Angle calculations between (hkl) and {h'k'l'} planes, and multiples
3 - Change crystal system
4 - Change wavelength
5 - Change conditions of existence
6 - Pole integration
7 - X-ray absorption coefficients and penetration depth
8 - Periodic table of the elements
9 - Defocusing curves: modifications for thin films, multilayers, fluorescence ...
10 - File transformations (Dubna, ILL, Beartex, LPEC, LLB, Mossbauer, INEL, Philips, Seifert, Socabim, Dosophatex, ...
11 - Intensity corrections
12 - Difference pole figures
13 - Reliability factors
This program allows the calculation of some parameters, useful for a direct pole figure and texture interpretation, in the case of bulk, thin film and multilayer specimen, and for eventual later analysis through other program packages.
All Crystal systems, systematic extinctions and wavelengths are available.
The functionalities of this program can be adapted to user's focus, on demand, and before to buy it.
0 - The summation of intensities over the entire pole figure range is useful for the first estimate of the distribution density. In the case of strong textures, where scanning grids are very narrow and the number of measured points out of every package possibility, this direct normalisation is also valid and provides quantitative informations.
Provided are the total number of counts per pole figure, the average count, the normalisation factor, the normalised intensity.
1 - When data corrections are analytically done, it is important to check ranges of errors thereby included. This option allows the calculation of absolute errors on the corrected data, using different calculation procedures. The program issues files with calculated errors.
2 - Calculates angles between a specific (hkl) plane, and all (h'k'l') and equivalents, to quickly identify poles in pole figures. A criterion is given by the operator, to include closeby reflections (in theta or dhk).
3 - To change the crystal system of the actual sample.
4 - To change to the working wavelength.
5 - To implement the systematic extinctions of rays depending on the space group.
6 - To integrate a pole in a pole figure.
7 - Calculates the x-ray mass absorption coefficient for any material, its linear absorption coefficient and penetration depth.
8 - To change properties of the elemnts necessary in other calculations like 7. Works with the file elts.lst
9 - Calculates defocusing correction curves for thin films and multilayer samples, fluorescent or not. Necessary inputs are the bulk experimental curves, the different thicknesses and absorption coefficients.
10 - Transforms ASCII file formats for many purposes. Experimental data available are for instance from/for ILL, LLB, X'PERT Philips, Beartex, INEL, Dosophatex, Socabim, LPEC-Le Mans, Dubna, LC-Grenoble, Earth & Planetary Science-Berkeley, Mossbauer-Nantes, Origin, Surfer, Igor, Mathematica ...
11 - Pole figure corrections, for simple background (neutrons), x-ray reflection techniques, for fluorescent or regular samples.
12 - Calculates the difference pole figure, in order to estimate reproducibility of pole figures from the Orientation Distribution.
13 - Calculates various reliability factors from experimental and recalculated pole figures, and normalisation factor.
References
Most of the author's literature can be downloaded here
H.G. Bunge, "Quantitative Texture Analysis", 1982, ed H.G. Bunge, p85-p128, DGM.
D. Chateigner, P. Germi, M. Pernet : J. Appl. Cryst., 25, 1992, 766-769.
D. Chateigner, P. Germi, M. Pernet : J. of Appl. Cryst., 27, 1994, 278-282.
D. Chateigner, P. Germi, M. Pernet : Proc. ICOTOM 10, Materials Science Forum, 157-162, 1994, 1379-1386.
D. Chateigner, P. Germi, M. Pernet, P. Fréchard & S. Andrieu: J. of Appl. Cryst., 28, 1995, 369-374.
D. Chateigner: International Union of Crystallography Newsletter "Commission on Powder Diffraction", 20, 1998, 10-12.
J.R. Holland : Advanc. X-ray Anal., 1964, 7, 86-93.
E.M.C. Huijser-Gerits & G.D. Rieck : J. of Appl. Cryst., 1974, 7, 286-290.
International Tables for Crystallography, vol. II, 106.
International Tables for Crystallography, vol. III, 157-200.
L.G. Schulz : J. of Appl. Phys., 1949, 20, 1030-1033.
E. Tenckhoff : J. of Appl. Phys., 1970, 41, 3944-3948.
H.-R. Wenk, S. Matthies, J. Donovan & D. Chateigner: J. Appl. Cryst. 31, 262 - 269.
